FEI Titan THEMIS 200 specifications

200 kV aberration corrected TEM/STEM microscope with image corrector

STEM modes: BF, DF, HAADF images

4 SDD EDS detectors built into the column

Specimen tilting in double tilt analytical holder:  X direction ± 35^o, Y direction ±30^o.

Field emission gun

CETA 16M camera